TY - JOUR
T1 - Theoretical prediction of S Kβ fine structures in PIXE-induced XRF spectra
AU - Uda, M.
AU - Yamamoto, T.
AU - Tatebayashi, T.
N1 - Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 1999/4/2
Y1 - 1999/4/2
N2 - Sulfur is one of the most important elements found in air pollutants. A PIXE-induced XRF system equipped with a crystal spectrometer is a candidate to analyze chemical states of S in the pollutants. To aid in the design of the spectrometer for this purpose, fundamental data have been collected by calculating S Kβ spectra by use of the discrete variational Xα (DV-Xα) method for molecular orbital calculations. The calculated spectra have very faithfully reproduced XRF spectra observed for mixtures of Na2SO4, Na2SO3 and ZnS using a Ge (1 1 1) flat crystal spectrometer, which were used as representative chemical species including SO42- and SO32-, and as an example of sulfides in the air pollutants.
AB - Sulfur is one of the most important elements found in air pollutants. A PIXE-induced XRF system equipped with a crystal spectrometer is a candidate to analyze chemical states of S in the pollutants. To aid in the design of the spectrometer for this purpose, fundamental data have been collected by calculating S Kβ spectra by use of the discrete variational Xα (DV-Xα) method for molecular orbital calculations. The calculated spectra have very faithfully reproduced XRF spectra observed for mixtures of Na2SO4, Na2SO3 and ZnS using a Ge (1 1 1) flat crystal spectrometer, which were used as representative chemical species including SO42- and SO32-, and as an example of sulfides in the air pollutants.
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U2 - 10.1016/S0168-583X(98)01085-4
DO - 10.1016/S0168-583X(98)01085-4
M3 - Conference article
AN - SCOPUS:0033515221
SN - 0168-583X
VL - 150
SP - 55
EP - 59
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
IS - 1-4
T2 - Proceedings of the 1998 8th International Conference on PIXE and its Analytical Applications
Y2 - 14 June 1998 through 18 June 1998
ER -