TY - JOUR
T1 - Thermo-mechanical reliability optimization of MEMS-based quartz resonator using validated finite element model
AU - Zhang, Rui
AU - Shi, Hongbin
AU - Dai, Yuehong
AU - Park, Jong Tae
AU - Ueda, Toshitsugu
PY - 2012/9
Y1 - 2012/9
N2 - This paper presents the investigation of the thermal mechanical reliability of a hydrogen gas sensor using MEMS-based quartz resonator by finite element analysis (FEA). The hydrogen gas senor has an internal heat source when in operating, the quartz resonator may subjected to thermal stress due to the thermal expansion coefficients (CTE) mismatch between the resonator and the LTCC package. This could cause cracks on the resonator and finally lead to failure of the sensor. Both thermal and thermo-mechanical simulations of a 3D model of the sensor were built using ANSYS software. Higher thermal mechanical stress level was found in the resonator based on the FEA, which is consistent with the results of verified experiments. Some optimal design was also carried out to improve the thermal reliability of the resonator based on validated finite element model.
AB - This paper presents the investigation of the thermal mechanical reliability of a hydrogen gas sensor using MEMS-based quartz resonator by finite element analysis (FEA). The hydrogen gas senor has an internal heat source when in operating, the quartz resonator may subjected to thermal stress due to the thermal expansion coefficients (CTE) mismatch between the resonator and the LTCC package. This could cause cracks on the resonator and finally lead to failure of the sensor. Both thermal and thermo-mechanical simulations of a 3D model of the sensor were built using ANSYS software. Higher thermal mechanical stress level was found in the resonator based on the FEA, which is consistent with the results of verified experiments. Some optimal design was also carried out to improve the thermal reliability of the resonator based on validated finite element model.
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U2 - 10.1016/j.microrel.2012.06.084
DO - 10.1016/j.microrel.2012.06.084
M3 - Article
AN - SCOPUS:84866736751
SN - 0026-2714
VL - 52
SP - 2331
EP - 2335
JO - Microelectronics and Reliability
JF - Microelectronics and Reliability
IS - 9-10
ER -