Thermo-mechanical reliability optimization of MEMS-based quartz resonator using validated finite element model

Rui Zhang*, Hongbin Shi, Yuehong Dai, Jong Tae Park, Toshitsugu Ueda

*この研究の対応する著者

    研究成果: Article査読

    5 被引用数 (Scopus)

    抄録

    This paper presents the investigation of the thermal mechanical reliability of a hydrogen gas sensor using MEMS-based quartz resonator by finite element analysis (FEA). The hydrogen gas senor has an internal heat source when in operating, the quartz resonator may subjected to thermal stress due to the thermal expansion coefficients (CTE) mismatch between the resonator and the LTCC package. This could cause cracks on the resonator and finally lead to failure of the sensor. Both thermal and thermo-mechanical simulations of a 3D model of the sensor were built using ANSYS software. Higher thermal mechanical stress level was found in the resonator based on the FEA, which is consistent with the results of verified experiments. Some optimal design was also carried out to improve the thermal reliability of the resonator based on validated finite element model.

    本文言語English
    ページ(範囲)2331-2335
    ページ数5
    ジャーナルMicroelectronics Reliability
    52
    9-10
    DOI
    出版ステータスPublished - 2012 9月

    ASJC Scopus subject areas

    • 電子工学および電気工学
    • 電子材料、光学材料、および磁性材料
    • 表面、皮膜および薄膜
    • 原子分子物理学および光学
    • 凝縮系物理学
    • 安全性、リスク、信頼性、品質管理

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