抄録
This paper examines the reduction of threading dislocation by a thin strained interlayer (SIL), and long-wavelength lasers fabricated on a GaAs substrate with SILs. Cross-sectional transmission electron microscope (TEM) is used to observe the dislocation blocking ability of a InGaP SIL inserted in an InP layer grown on a GaAs substrate. The characteristics of the lasers are improved due to dislocation reduction. Their threshold current is reduced to 70% on average and is also distributed more uniformly.
本文言語 | English |
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ページ | 610-612 |
ページ数 | 3 |
出版ステータス | Published - 1992 12月 1 |
外部発表 | はい |
イベント | Extended Abstracts of the 1992 International Conference on Solid State Devices and Materials - SSDM '92 - Tsukuba, Jpn 継続期間: 1992 8月 26 → 1992 8月 28 |
Other
Other | Extended Abstracts of the 1992 International Conference on Solid State Devices and Materials - SSDM '92 |
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City | Tsukuba, Jpn |
Period | 92/8/26 → 92/8/28 |
ASJC Scopus subject areas
- 工学(全般)