TY - GEN
T1 - Topology-Optimization-Based EMC Design
AU - Nomura, Katsuya
AU - Takahashi, Atsuhiro
AU - Kojima, Takashi
AU - Yamasaki, Shintaro
AU - Yaji, Kentaro
AU - Bo, Hiroki
AU - Fujita, Kikuo
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/9
Y1 - 2019/9
N2 - In electromagnetic compatibility (EMC) design, it is important to mitigate the dominant effect among those caused by many unintentional parasitic elements or couplings. However, the dominant effect is usually unclear and hence EMC engineers often resort to trial and error to find an effective counterplan. This paper presents an approach for aiding engineers in finding a better design plan using topology optimization, which is a simulation-based structural optimization method. The proposed approach is applied to the conductor pattern design in simple circuits of electromagnetic interference filters, in which the dominant effect is conduction or induction noise depending on the circuit parameters. It is demonstrated that a structure with a reduced dominant effect is obtained automatically, and the utilization of the optimized result for EMC design is also discussed.
AB - In electromagnetic compatibility (EMC) design, it is important to mitigate the dominant effect among those caused by many unintentional parasitic elements or couplings. However, the dominant effect is usually unclear and hence EMC engineers often resort to trial and error to find an effective counterplan. This paper presents an approach for aiding engineers in finding a better design plan using topology optimization, which is a simulation-based structural optimization method. The proposed approach is applied to the conductor pattern design in simple circuits of electromagnetic interference filters, in which the dominant effect is conduction or induction noise depending on the circuit parameters. It is demonstrated that a structure with a reduced dominant effect is obtained automatically, and the utilization of the optimized result for EMC design is also discussed.
KW - conductor pattern
KW - dominant effect
KW - EMC design
KW - Topology optimization
UR - http://www.scopus.com/inward/record.url?scp=85074347020&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85074347020&partnerID=8YFLogxK
U2 - 10.1109/EMCEurope.2019.8871981
DO - 10.1109/EMCEurope.2019.8871981
M3 - Conference contribution
AN - SCOPUS:85074347020
T3 - EMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility
SP - 933
EP - 937
BT - EMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019
Y2 - 2 September 2019 through 6 September 2019
ER -