抄録
We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.
本文言語 | English |
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ページ(範囲) | 601-604 |
ページ数 | 4 |
ジャーナル | Optical Review |
巻 | 4 |
号 | 5 |
DOI | |
出版ステータス | Published - 1997 1月 1 |
外部発表 | はい |
ASJC Scopus subject areas
- 原子分子物理学および光学