TY - GEN
T1 - Two-dimensional heteroscedastic linear discriminant analysis for age-group classification
AU - Ueki, Kazuya
AU - Hayashida, Teruhide
AU - Kobayashi, Tetsunori
PY - 2006
Y1 - 2006
N2 - This paper presents a novel LDA algorithm named 2DHLDA (2-Dimensional Heteroscedastic Linear Discriminant Analysis). The proposed algorithms are applied on age-group classification using facial images under various lighting conditions. 2DHLDA significantly overcomes the singularity problem, so-called 'Small Sample Size' problem (S3 problem), and the original feature space is split into useful dimensions and nuisance dimensions to reduce the influence of different lighting conditions. A two-phased dimensional reduction step, namely 2DHLDA+LDA, is used in our experiment. Our experimental results show that the new 2DHLDA-based approach improves classification accuracy more than the conventional 1D and 2D-based approaches.
AB - This paper presents a novel LDA algorithm named 2DHLDA (2-Dimensional Heteroscedastic Linear Discriminant Analysis). The proposed algorithms are applied on age-group classification using facial images under various lighting conditions. 2DHLDA significantly overcomes the singularity problem, so-called 'Small Sample Size' problem (S3 problem), and the original feature space is split into useful dimensions and nuisance dimensions to reduce the influence of different lighting conditions. A two-phased dimensional reduction step, namely 2DHLDA+LDA, is used in our experiment. Our experimental results show that the new 2DHLDA-based approach improves classification accuracy more than the conventional 1D and 2D-based approaches.
UR - http://www.scopus.com/inward/record.url?scp=34047193244&partnerID=8YFLogxK
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U2 - 10.1109/ICPR.2006.1138
DO - 10.1109/ICPR.2006.1138
M3 - Conference contribution
AN - SCOPUS:34047193244
SN - 0769525210
SN - 9780769525211
T3 - Proceedings - International Conference on Pattern Recognition
SP - 585
EP - 588
BT - Proceedings - 18th International Conference on Pattern Recognition, ICPR 2006
T2 - 18th International Conference on Pattern Recognition, ICPR 2006
Y2 - 20 August 2006 through 24 August 2006
ER -