V 2p core-level spectroscopy of V2+/V3+ mixed valence AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18

S. Dash*, T. Kajita, T. Yoshino, N. L. Saini, T. Katsufuji, T. Mizokawa

*この研究の対応する著者

研究成果: Article査読

6 被引用数 (Scopus)

抄録

We have studied the surface electronic structure of AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2p XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV10O15 (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2p3/2, in order to obtain the results consistent with the bulk sensitive HAXPES study.

本文言語English
ページ(範囲)11-20
ページ数10
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
223
DOI
出版ステータスPublished - 2018 2月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 放射線
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 分光学
  • 物理化学および理論化学

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