Whitespace insertion for through-silicon via planning on 3-D SoCs

Wei Zhong*, Song Chen, Takeshi Yoshimura

*この研究の対応する著者

研究成果: Conference contribution

8 被引用数 (Scopus)

抄録

As technology advances, 3-D ICs can significantly alleviate the interconnect problem coming with the decreasing of feature size and are promising for heterogeneous integration. In 3-D ICs, one of the key challenges is the vertical technology, using through-silicon via (TSV) for different device layers connection. In this paper, by noticing the TSV assignment comes under the influence of the whitespace distribution in a given 3-D floorplan, we proposed an algorithm called whitespace insertion (WSI) based on the floorplan-representation Sequence Pair to make the whitespace distribution in the given floorplan more reasonable for TSV insertion. When given 3-D circuit placement or floorplan results, we also proposed a minimum spanning tree based algorithm for TSV assignment to minimize the total wire length, assuming each net may have at most one TSV on each device layer. Experimental results show that, in the given 3-D floorplans there is a huge gap about 45.54% of the wire length increase between the ideal and the practice. And based on our method, the total wire length can be reduced by 13% on average without changing the chip area.

本文言語English
ホスト出版物のタイトルISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems
ページ913-916
ページ数4
DOI
出版ステータスPublished - 2010
イベント2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010 - Paris
継続期間: 2010 5月 302010 6月 2

Other

Other2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010
CityParis
Period10/5/3010/6/2

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学

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